Lithography Mask

UHV
Duration
120 s
Total
2,577,600,000 EU
Usage
1,074,000 EU/t
Conditions and notes
  • Research Points
  • Ray Wavelength: 749 nm~751 nm
  • Ray Intensity: >6400 a.u.
  • Vacuum Tier: 4
  • Requires a beam with wavelength 749nm~751nm and intensity above 6400a.u.

gtceu:beam_guided_computation_testing/optical_computing_channel